Sheet resistance tester(ol) - List of Manufacturers, Suppliers, Companies and Products

Sheet resistance tester Product List

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EddyCus(R) TF lab 4040SR-OT-OR-H

EddyCus(R) TF lab 4040SR-OT-OR-H

For non-contact measurements such as photovoltaic cells, semiconductors, and transparent static prevention boards!

The "EddyCus(R) TF lab 4040SR-OT-OR-H" is a non-contact sheet resistance and optical transmission measurement device that allows for accurate measurement of the sheet resistance (Ohm/sq), light transmittance, and reflection of conductive thin films. It features easy-to-use software for manual mapping and is used for measuring photovoltaic cells, semiconductors, and transparent static electricity prevention boards. Precise measurements of conductive thin films, self-supporting structures, and grid/wire structures are possible. 【Features】 ■ Non-contact measurement ■ Real-time measurement ■ Precise measurement ■ User-friendly software ■ Manual mapping *For more details, please refer to the PDF document or feel free to contact us.

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EddyCus(R)TF lab 2020 series

EddyCus(R)TF lab 2020 series

Manual mapping measurements of sheet resistance are possible using user-friendly software.

The "EddyCus(R)TF lab 2020 series" is a non-contact sheet resistance measurement device. It accurately measures the sheet resistance of conductive films at a single point. Additionally, it can measure the thickness of metal film layers and monitor the thickness of thin films and substrates. Upon request, we evaluate the characteristics of multi-layer systems. 【Features】 ■ Non-contact type ■ Real-time measurement ■ Accurately measures the sheet resistance of conductive films at a single point (Ohm/sq) ■ Measures the thickness of metal film layers (nm) *For more details, please refer to the PDF document or feel free to contact us.

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EddyCus(R) TF inline series

EddyCus(R) TF inline series

A suitable solution for measuring the thickness of metal layers, light transmittance, density, and electrical anisotropy.

The "EddyCus(R) TF inline series" is a non-contact inline sheet resistance measurement solution capable of measuring the sheet resistance of thin films and the thickness of metal film layers. It offers advanced variability and flexibility, suitable for both vacuum and atmospheric environments. Equipped with an easy-to-use GUI, comprehensive software, SQL database, statistics, and export features. 【Features】 ■ Non-contact & real-time measurement ■ Accurate measurements ■ Advanced variability and flexibility ■ Suitable for both vacuum and atmospheric environments ■ Supports single lane and multiple lanes *For more details, please refer to the PDF document or feel free to contact us.

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